X-Ray Diffractometer
Analytical technique description:
X ray diffractometry with accessories for microdiffraction. The XRD is one of most used techniques for the study of crystalline components in a complex system. It provides qualitative and quantitative information.
Applications:
The technique is used for archaeometric studies and for the assessment of the conservation state of natural and artificial stone materials (mortar, ceramics, etc.), for the study of pigments and their alteration, for the study of the alteration phases of metals and the crystalline phases in the glass.
Cross sections, thin sections and microsamples (spot 100 µm) can be analyzed with the micro diffraction system.
Basics: The method is based on the effects of the interference of a X radiation with the crystal lattice. The reticle, hit by a radiation of wavelength λ of the same order of the distances of the lattice planes, diffracts the radiation according to a certain angle θ. This principle is known as Bragg's Law (nλ = 2dsinθ).
The X-ray diffraction by the various lattice planes provides a series of peaks variables for position and intensity, which constitute the diffraction spectrum characteristic of crystalline substance analyzed.
Instrumental details: Diffrattometro X’Pert PRO PANalytical ad anticatodo di rame, dotato di multirivelatore X’ Celeretor e sistema per microdiffrazione (Florence Unit).
ICVBC - AREA DI RICERCA CNR DI FIRENZE
Via Madonna del Piano, 10 - 50019 Sesto Fiorentino (FI)
Tel. 055 5225484 - Fax 055 5225483
Institute for the Conservation and Valorization of Cultural Heritage